Analysis patterns : reusable object models reusable object models / Alan V. Oppenheim, Ronald W. Schafer, John R. Buck.

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TextLanguage: English Publication details: America: Prentice Hall; 1999.Description: xxvi, 870 p. : ill; 24 cmISBN:

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Holdings
Cover image	Item type	Current library	Home library	Collection	Shelving location	Call number	Materials specified	Vol info	URL	Copy number	Status	Notes	Date due	Barcode	Item holds	Item hold queue priority	Course reserves
	Books	JCC Rouf Library General Stacks				621.3822 OPP 1999				C-1	Available	BDT		19850

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